Scientific Computing International (SCI) provides high resolution thin film metrology tools and analysis software products to leading companies in the semiconductor, optoelectronics, display, MEMS, data storage, and optical coating industries. SCI also provides software for optical thin film design and material analysis including FilmWizard, an optical thin film design and material analysis program, and FilmEllipse, an analysis and acquisition tool that can be used with any ellipsometer. (Ellipsometer, reflectometer, polarimeter, reflection, transmission, ellipsometry, duv spectroscopic ellipsometer, NIR spectroscopic ellipsometer, spectrophotometer, spectroscopic ellipsometer, film thickness, index of refraction, optical constants, index, thickness, extinction coefficient, birefringence, energy band gap, surface roughness, crystallinity, film properties versus temperature, multilayer thicknesses, integrated metrology modules, semiconductor, III-V compound semiconductor, optoelectroni

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